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2000, International Materials Reviews
Any discussion concerning SiC as a material for MEMS first requires a basic understanding of these Silicon carbide (SiC) has recently attracted micromachining processes. attention as a wide bandgap semiconductor with great potential for microelectromechanical Bulk micromachining was developed in the 1970s systems (MEMS). SiC exhibits excellent electrical, as an extension of IC technology for the fabrication mechanical, and chemical properties, making it of three-dimensional structures.1 Bulk micromachinwell suited for harsh environment applications ing of silicon uses wet and dry etching techniques in where traditional MEMS are constrained by the conjunction with etch masks and etch stops to sculpt physical limitations of silicon (Si). This paper micromechanical devices from the Si substrate. There reviews the material properties, deposition are two key capabilities that make bulk micromachintechniques, micromachining processes, and other ing of Si a viable technology. First, the availability of issues regarding the fabrication of SiC-based anisotropic etchants of Si such as ethylene-diamine sensors and actuators. Special emphasis is placed pyrocatecol (EDP) and potassium hydroxide (KOH), on the properties that make SiC attractive for MEMS, and the Si-based processing techniques which preferentially etch single crystal Si along select that have been adapted to realise SiC MEMS crystal planes. Second, the availability of etch masks structures and devices. An introduction to and etch-stop techniques which can be used in conmicromachining is provided for readers not junction with silicon anisotropic etchants to prevent familiar with MEMS fabrication techniques.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 2003
A simple one-step inductively coupled plasma etching technique has been developed for the fabrication of SiC resonant beam structures. Straight cantilever and bridge devices have been made successfully. The structures have been actuated and resonant frequencies ranging from ϳ120 kHz to ϳ5 MHz have been measured. Comparison of the theoretically simulated and experimentally measured resonant frequencies shows the presence of significant tensile stress in bridge structures while the cantilever beams are free of stress. The degree of the tension in the bridge structures has been found to be independent of the bridge length.
Due to its desirable material properties, Silicon Carbide (SiC) has become an alternative material to replace Si for Microelectromechanical Systems (MEMS) applications in harsh environments. To promote SiC MEMS development towards future cost-effective products, main technology areas in material deposition and processes have attracted significant interest. The developments in these areas have contributed to the rapid emergence of SiC MEMS prototypes. In this paper, we give an overview of the important developments in SiC material formation and fabrication processes in recent years. Some of the most interesting state-of-the-art SiC MEMS devices are reviewed. This highlights the major progresses in SiC MEMS developed thus far. This paper also looks into the prospect of SiC MEMS drawing attention to potential issues.
physica status solidi (b), 2008
Large area (up to 4") polycrystalline 3C-SiC films have been deposited by Electron Cyclotron Resonance Chemical Vapor Deposition (ECR-CVD) technique. Crystalline and non crystalline substrates such as (100) Si wafers, thermally oxidized Si wafers and Al2O3 ceramic sheets have been used, maintaining the same deposition conditions. The structural and morphological properties of the films were analyzed by means of Transmission Electron Microscopy (TEM) and X-Ray Diffractometry (XRD), while surface morphology was characterized by Atomic Force Microscopy (AFM). Preliminary results on technological processes for the realization of polycrystalline SiC based micro-electro-mechanical systems (MEMS) are reported.
MRS Proceedings, 2010
Silicon carbide has robust mechanical, electrical, and chemical properties which make it an attractive material candidate for micro- and nano-electromechanical systems (MEMS and NEMS). 3C-SiC films grown via a polysilicon seed-layer CVD-deposited on an oxide coated (111) Si substrate offers an innovative method to overcome the residual film stress issues associated with 3C-SiC heteroepitaxy and the difficulties of fabricating structures from 3C-SiC films. The oxide plays a dual role by permitting film relaxation with respect to the supporting substrate and functioning as a MEMS release layer, allowing MEMS structures such as cantilevers and diaphragms, to be easily fabricated from the 3C-SiC film. The impact of the oxide layer on the relaxation of the film stress was investigated by comparing direction-sensitive MEMS stress sensors fabricated from 3C-SiC films grown via a polysilicon-on-oxide-coated-substrate and a polysilicon-on-crystalline Si substrate. Scanning Electron Microscop...
Proceedings, 2017
Metal assisted photochemical etching (MAPCE) of 4H Silicon Carbide (SiC) was utilized to generate locally defined porous areas on single crystalline substrates. Therefore, Platinum (Pt) was sputter deposited on 4H-SiC substrates and patterned with photolithography and lift off. Etching was performed by immersing the Pt coated samples into an etching solution containing sodium persulphate and hydrofluoric acid. UV light irradiation was necessary for charge carrier generation while the Pt served as local cathode. The generated porous areas can be used for the generation of integrated cavities in the single crystalline SiC substrates when covered with a chemical vapor deposited thin film of poly-crystalline SiC.
Journal of Micromechanics and Microengineering, 2006
We have successfully fabricated freestanding single-crystal 6H-SiC cantilevers of several microns size using bulk micromachining with an inductively coupled plasma reactive ion etching system. We have also used these SiC cantilever structures to measure Young's modulus through the use of an atomic force microscope. The measurements were performed on a series of 13 µm thick and 20 µm wide cantilevers with lengths ranging from 100 µm to 350 µm. The average measured Young's modulus of 441 GPa is in excellent agreement with the documented values in the literature.
Journal of Electronic Materials, 2002
Journal of Crystal Growth, 2009
The growth of highly oriented 3C-SiC directly on an oxide release layer, composed of a 20-nm-thick poly-Si seed layer and a 550-nm-thick thermally deposited oxide on a (111)Si substrate, was investigated as an alternative to using silicon-on-insulator (SOI) substrates for freestanding SiC films for MEMS applications. The resulting SiC film was characterized by X-ray diffraction (XRD) with the X-ray rocking curve of the (111) diffraction peak displaying a FWHM of 0.1151 (414 00 ), which was better than that for 3C-SiC films grown directly on (111)Si during the same deposition process. However, the XRD peak amplitude for the 3C-SiC film on the poly-Si seed layer was much less than for the (111)Si control substrate, due to slight in-plane misorientations in the film. Surprisingly, the film was solely composed of (111) 3C-SiC grains and possessed no 3C-SiC grains oriented along the /3 11S and /11 0S directions which were the original directions of the poly-Si seed layer. With this new process, MEMS structures such as cantilevers and membranes can be easily released leaving behind high-quality 3C-SiC structures.
Advances in Science and Technology, 2008
Silicon Carbide (SiC) is a very promising material for the fabrication of a new category of sensors and devices, to be used in very hostile environments (high temperature, corrosive ambient, presence of radiation, etc.). The fabrication of SiC MEMS-based sensors requires new processes able to realize microstructures on bulk material or on the SiC surface. The hetero-epitaxial growth of 3C-SiC on silicon substrates allows one to overcome the traditional limitations of SiC microfabrication. This approach puts together the standard silicon bulk microfabrication methodologies with the robust mechanical properties of 3C-SiC. Using this approach we were able to fabricate SiC cantilevers for a new class of pressure sensor. The geometries studied were selected in order to study the internal residual stress of the SiC film. X-Ray Diffraction polar figure and Bragg-Brentano scan analysis were used to check to crystal structure and the orientations of the film. SEM analysis was performed to analyze the morphology of the released MEMS structures.
Journal of The Electrochemical Society, 2004
We report the deposition of 3C-SiC films on an Si͑100͒ substrate from 1,3-disilabutane precursor molecule utilizing a conventional low-pressure chemical vapor deposition ͑CVD͒ system. The chemical, structural, and growth properties of the resulting films are investigated as functions of deposition temperature and flow rates. Based on X-ray photoelectron spectroscopy, the films deposited at temperatures as low as 650°C are indeed carbidic. X-ray diffraction analysis indicates the films to be amorphous up to 750°C, above which they become polycrystalline. The effect of process parameters on film uniformity is also reported. Highly uniform films are achieved at 800°C and lower, essentially independent of the flow rate.
Journal of Applied Physics, 2009
The effects of rapid thermal annealing ͑RTA͒ on amorphous hydrogenated carbon-coated film on Si wafer, deposited by CH 4 / Ar dielectric barrier discharge plasma ͑at half of the atmospheric pressure͒, was examined. Bubbles-like structures were formed on the surface of the deposited carbon-coated film. The surface morphology studied by scanning electron microscopy ͑SEM͒, which showed that the effect of RTA on the film changing the morphological property drastically at 600°C and most of the bubbles started evaporating above 200°C. The inbuilt energy dispersive x-ray in SEM gives the quantitative analysis of the annealed surface. X-ray photoelectron spectroscopy results of the as-deposited films agree with the IR results in that the percent of Si-CH 3 , Si-O-Si and C-O͑H͒ stretching vibrational band in the film. Most of these bands disappeared as the sample was annealed at 600°C in Ar medium.
Applied Physics Letters, 2010
Highly c-axis oriented heteroepitaxial aluminum nitride ͑AlN͒ films were grown on epitaxial cubic silicon carbide ͑3C-SiC͒ layers on Si ͑100͒ substrates using alternating current reactive magnetron sputtering at temperatures between approximately 300-450°C. The AlN films were characterized by x-ray diffraction, scanning electron microscope, and transmission electron microscopy. A two-port surface acoustic wave device was fabricated on the AlN/3C-SiC/Si composite structure, and an expected Rayleigh mode exhibited a high acoustic velocity of 5200 m/s. The results demonstrate the potential of utilizing AlN films on epitaxial 3C-SiC layers to create piezoelectric resonant devices.
Electrochemical and Solid-State Letters, 2002
The chemical and microstructural characteristics of silicon carbide films deposited on 100 mm diam, silicon ͑100͒ wafers in a large-volume, low-pressure chemical vapor deposition ͑LPCVD͒ furnace using dichlorosilane (SiH 2 Cl 2 ) and acetylene (C 2 H 2 ) were investigated. The deposition temperature was held constant at 900°C and the pressure ranged between 460 and 510 mTorr. X-ray photoelectron spectroscopy data indicated that stoichiometric SiC was deposited using SiH 2 Cl 2 -to-C 2 H 2 molar ratios of 4:1, 6:1, and 8:1. X-ray diffraction showed that the stoichiometric films were highly textured, 3C-SiC͑111͒ at all locations across each wafer. These findings indicate that the SiH 2 Cl 2 /C 2 H 2 precursor system has great potential for use in large-scale LPCVD furnaces and produces SiC films with a microstructure that has advantageous properties for use in high-frequency resonator micromechanical devices.
Journal of Micromechanics and Microengineering, 2013
Surface acoustic wave (SAW) propagation characteristics in a multilayer structure including a piezoelectric aluminum nitride (AlN) thin film and an epitaxial cubic silicon carbide (3C-SiC) layer on a silicon (Si) substrate are investigated by theoretical calculation in this work. Alternating current (ac) reactive magnetron sputtering was used to deposit highly c-axis-oriented AlN thin films, showing the full width at half maximum (FWHM) of the rocking curve of 1.36 • on epitaxial 3C-SiC layers on Si substrates. In addition, conventional two-port SAW devices were fabricated on the AlN/3C-SiC/Si multilayer structure and SAW propagation properties in the multilayer structure were experimentally investigated. The surface wave in the AlN/3C-SiC/Si multilayer structure exhibits a phase velocity of 5528 m s −1 and an electromechanical coupling coefficient of 0.42%. The results demonstrate the potential of AlN thin films grown on epitaxial 3C-SiC layers to create layered SAW devices with higher phase velocities and larger electromechanical coupling coefficients than SAW devices on an AlN/Si multilayer structure. Moreover, the FWHM values of rocking curves of the AlN thin film and 3C-SiC layer remained constant after annealing for 500 h at 540 • C in air atmosphere. Accordingly, the layered SAW devices based on AlN thin films and 3C-SiC layers are applicable to timing and sensing applications in harsh environments.
Journal of Applied Physics, 2009
Polycrystalline 3C-SiC thin films are deposited on 100 mm Si͑100͒ wafers via low pressure chemical vapor deposition from the precursor methylsilane in the temperature range of 700-850 °C. Residual stress, strain, and strain gradient are characterized as functions of deposition pressure, temperature, and dichlorosilane as an additional silicon source. By optimizing the deposition parameters, the residual stress is found to decrease from 1377Ϯ 10 to 196Ϯ 19 MPa. The low stress film exhibits a strain of 3.4ϫ 10 -4 , corresponding to Young's modulus of 455 GPa, and strain gradient of -8 ϫ 10 -4 m -1 . The analysis suggests that the change in stress values is due to a combination of effects, in particular, thermal mismatch, grain size effect, and chemical composition.
Micromachines, 2020
A search of the recent literature reveals that there is a continuous growth of scientific publications on the development of chemical vapor deposition (CVD) processes for silicon carbide (SiC) films and their promising applications in micro- and nanoelectromechanical systems (MEMS/NEMS) devices. In recent years, considerable effort has been devoted to deposit high-quality SiC films on large areas enabling the low-cost fabrication methods of MEMS/NEMS sensors. The relatively high temperatures involved in CVD SiC growth are a drawback and studies have been made to develop low-temperature CVD processes. In this respect, atomic layer deposition (ALD), a modified CVD process promising for nanotechnology fabrication techniques, has attracted attention due to the deposition of thin films at low temperatures and additional benefits, such as excellent uniformity, conformability, good reproducibility, large area, and batch capability. This review article focuses on the recent advances in the ...
Journal of Vacuum Science & Technology A
Polyamide films were grown on Si(111) using a molecular layer deposition (MLD) process with 1,2-ethylenediamine and trimesoyl chloride precursors at 120 °C. Synthesized polyamide films on Si(111) were then pyrolyzed in vacuum (10−7 Torr) to yield crystalline SiC thin films. High-resolution transmission electron microscope images of heat-treated samples showed the heteroepitaxial nature of the synthesized 3C-SiC (β-SiC) with respect to the Si(111) substrate. Raman, x-ray photoelectron spectroscopy, and x-ray diffraction analysis confirmed the formation of single-crystal SiC films. Samples pyrolyzed at 1300 °C showed defects attributed to Si sublimation. Formation of highly conformal SiC film after pyrolysis was demonstrated using Bosch-processed Si trenches. The thicknesses of 3C-SiC films obtained after pyrolysis were linearly dependent on the number of MLD cycles used to deposit polyamide films.
Materials Science Forum, 2009
Single crystal 3C-SiC films were grown on and Si substrate orientations in order to study the resulting mechanical properties of this material. In addition, poly-crystalline 3C-SiC was also grown on (100)Si so that a comparison with monocrystaline 3C-SiC, also grown on (100)Si, could be made. The mechanical properties of single crystal and polycrystalline 3C-SiC films grown on Si substrates were measured by means of nanoindentation using a Berkovich diamond tip. These results indicate that polycrystalline SiC thin films are attractive for MEMS applications when compared with the single crystal 3C-SiC, which is promising since growing single crystal 3C-SiC films is more challenging. MEMS cantilevers and membranes fabricated from a 2 µm thick single crystal 3C-SiC grown on (100)Si under similar conditions resulted in a small degree of bow with only 9 µm of deflection for a cantilever of 700 µm length with an estimated tensile film stress of 300 MPa. Single crystal 3C-SiC films on (111)Si substrates have the highest elastic and plastic properties, although due to high residual stress they tend to crack and delaminate.
Single crystal 3C-SiC films were grown on and Si substrate orientations in order to study the resulting mechanical properties of this material. In addition, poly-crystalline 3C-SiC was also grown on (100)Si so that a comparison with monocrystaline 3C-SiC, also grown on (100)Si, could be made. The mechanical properties of single crystal and polycrystalline 3C-SiC films grown on Si substrates were measured by means of nanoindentation using a Berkovich diamond tip. These results indicate that polycrystalline SiC thin films are attractive for MEMS applications when compared with the single crystal 3C-SiC, which is promising since growing single crystal 3C-SiC films is more challenging. MEMS cantilevers and membranes fabricated from a 2 µm thick single crystal 3C-SiC grown on (100)Si under similar conditions resulted in a small degree of bow with only 9 µm of deflection for a cantilever of 700 µm length with an estimated tensile film stress of 300 MPa. Single crystal 3C-SiC films on (111)Si substrates have the highest elastic and plastic properties, although due to high residual stress they tend to crack and delaminate.
Proceedings of the IEEE, 1998
Silicon carbide (SiC) is a promising material for the development of high-temperature solid-state electronics and transducers, owing to its excellent electrical, mechanical, and chemical properties. This paper is a review of silicon carbide for microelectromechanical systems (SiC MEMS). Current efforts in developing SiC MEMS to extend the silicon-based MEMS technology to applications in harsh environments are discussed. A summary is presented of the material properties that make SiC an attractive material for use in such environments. Challenges faced in the development of processing techniques are also outlined. Last, a review of the current state of SiC MEMS devices and issues facing future progress are presented.
Physics and Technology of Silicon Carbide Devices, 2012
MRS …, 2010
X-Ray Diffraction was used to evaluate the crystalline quality of the epilayers. Scanning Electron Microscopy observations of static cantilever deflection highlight the major difference between the stress states of (100) and (111) oriented layers for which the intrinsic stresses are of ...
Sensors and Actuators A: Physical, 2002
A low-temperature chemical vapor deposition (CVD) process utilizing the single precursor molecule 1,3-disilabutane (DSB) is used to grow polycrystalline cubic silicon carbide (SiC) ®lms for microelectromechanical systems (MEMS) applications at temperatures of 800± 1000 8C and pressures between 10 À4 and 10 À5 Torr. With this deposition method, the fabrication of an all-SiC cantilever beam array is shown using standard microfabrication processes. Additionally, the coating of released polycrystalline Si (polySi) micromachines with SiC ®lms is achieved. Conformal, pin±hole free coatings are obtained at 800 8C yielding composite microstructures that can be actuated and exhibit superior chemical and mechanical properties when compared to their Si analogs.
This chapter looks at the role of silicon carbide (SiC) in microsystem technology. It starts with an introduction into the wide bandgap (WBG) materials and the properties that make them potential candidates to enable the development of harsh environment microsystems. The future commercial success of WBG microsystems depends mainly on the availability of high-quality materials, well-established microfabrication processes, and economic viability. In such aspects SiC platform, in relation to other WBG materials, provides a clear and competitive advantage. The reasons for this will be detailed. Furthermore, the current status of the SiC thin film and bulk material technologies will also be discussed. Both SiC material forms have played important roles in different microsystem types.
2011
A low-temperature (< 300 • C) low-stress microelectromechanical systems fabrication process based on a silicon carbide structural layer is presented. A partially conductive sintered target enables low-temperature dc sputtering of amorphous silicon carbide (SiC) at high deposition rates (75 nm/min). The low stress of the structural film allows for mechanically reliable structures to be fabricated, while the low-temperature deposition allows for pre-SiC metallization. The process is designed for low-cost film deposition and for complementary metal-oxide-semiconductor postintegration, stemming from chemical and thermal compatibility. Process flow, deposition, etching, and stress control are discussed, and a detailed process characterization is reported.
Materials Science Forum, 2011
MRS Proceedings, 2007
There is a technological need for hard thin films with high elastic modulus and fracture toughness. Silicon carbide (SiC) fulfills such requirements for a variety of applications at high temperatures and for high-wear MEMS. A detailed study of the mechanical properties of single crystal and polycrystalline 3C-SiC films grown on Si substrates was performed by means of nanoindentation using a Berkovich diamond tip. The thickness of both the single and polycrystalline SiC films was around 1-2 µm. Under indentation loads below 500 µN both films exhibit Hertzian elastic contact without plastic deformation. The polycrystalline SiC films have an elastic modulus of 457 + 50 GPa and hardness of 33.5 + 3.3 GPa, while the single crystalline SiC films elastic modulus and hardness were measured to be 433 + 50 GPa and 31.2 + 3.7 GPa, respectively. These results indicate that polycrystalline SiC thin films are more attractive for MEMS applications when compared with the single crystal 3C-SiC, which is promising since growing single crystal 3C-SiC films is more challenging.
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